1. Scope and purpose
1. This document describes the different characteristic of ESD protection devices (TVS diodes) from the standard one up to the most efficient SCR (Silicon Controlled Rectifier) structures。
2. ESD protection devices based on SCR structures can cause a “latch-up”. Based on a “load-line analysis” stable operating conditions of SCR based ESD protection devices in various applications become visible。
3. A detailed latch-up analysis is performed for High-Speed interfaces e.g. USB3.x, HDMI,…